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Surface Analysis Workshop - Wednesday 27th February 2008
Wednesday, 16 January 2008

Venue: CSMA Headquarters, Stoke-on-Trent
Registration fee:

The West Midlands ICT Hub in association with Photonics Cluster (UK) are delighted to highlight the forthcoming workshop which we consider will be of strong interest to anyone who requires to operate within precise measurement tolerances.

CSMA's surface analysis workshop will be split into a morning of presentations on the main techniques including industrial case studies and an afternoon of laboratory demonstrations.

There will also be opportunities to meet the CSMA scientific team during coffee and lunch.

Attendees are invited to bring a sample for discussion with a member of CSMA’s scientific team.

9.30-10.00 Registration and coffee

10.00-10.15 Welcome and Introduction
Dr. Chris Pickles, Managing Director

10.15-10.50 Quantitative Surface Analysis and Chemical State Mapping - Rob Mitchell

10.50-11.25 Surface Topography and Layer Thickness Measurement - Dr. Alan Brown

11.25-11.50 Coffee

11.50-12.25 Molecular Imaging of Surfaces - Dr. Jean-Claude Canry

12.25-13.00 Elemental Composition of Sub-Surface Layers and Interfaces - Dr. Clive Jones

13.00-14.00 Lunch

14.00-16.30 Laboratory demonstrations
Demonstrations on:

  • XPS (X-ray Photoelectron Spectroscopy)
  • 3DP (3D Non-Contact Surface Profiling)
  • ToFSIMS (Time of Flight Secondary Ion Mass Spectrometry)
  • DSIMS (Dynamic Secondary Ion Mass Spectrometry) depth profiling

Please indicate your preferred demo on the registration form. There will be time for one-to-one discussions on specific samples.

Please request a registration sheet by email to ICT HUb on This e-mail address is being protected from spambots. You need JavaScript enabled to view it

 
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